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IEEE Electron Device Letters > 2018 > 39 > 1 > 147 - 150
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 314 - 321
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 31 - 37
IEEE Transactions on Electron Devices > 2018 > 65 > 1 > 19 - 22
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2018 > 37 > 1 > 110 - 122
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 5081 - 5086
IEEE Journal of Solid-State Circuits > 2017 > 52 > 12 > 3486 - 3502
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 5284 - 5287
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 5263 - 5269
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 5172 - 5180
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 5274 - 5278
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 5107 - 5113
IEEE Electron Device Letters > 2017 > 38 > 12 > 1657 - 1660
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 4910 - 4918
IEEE Transactions on Circuits and Systems II: Express Briefs > 2017 > 64 > 12 > 1367 - 1371
IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4457 - 4465
IEEE Transactions on Nanotechnology > 2017 > 16 > 6 > 1081 - 1087
IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4607 - 4614
IEEE Transactions on Semiconductor Manufacturing > 2017 > 30 > 4 > 468 - 474